Managing 2D Charts

The 2D Chart tile displays the graphical views for a selected statistic of process performance based on historical data from process-feature combinations, including Cpk, Ppk, yield (expected and potential) and mean, among others.

When you select the parameter set on the dashboard, it will affect the contents of this tile.

1. In the aggregated dashboard toolbar, select Add Tile and then select the 2D Chart tile.

   

2. In the 2D Chart tile, you can do the following:

   • Selecting Parameter Sets
   • Maximising Tile

     Using this procedure, you will maximise the 2D Chart on the dashboard.

     1. In the 2D Chart, select More and then select Maximise .
     2. The 2D Chart maximises.
   • Restoring Tile

     Using this procedure, you will restore the 2D Chart to its original size.

     1. In the 2D Chart, select More and then select Restore .
     2. The 2D Chart restores to its original size.
   • Displaying Statistic

     Using this procedure, you will select the statistic displayed in the 2D Chart tile.

     1. In the 2D Chart tile, select More and then select Display .

        

     2. In the Select Statistic drop-down list, select the desired statistic.

        Available Statistics

        • Cpk. Capability ratio that is adjusted for non-centred processes, using short-term standard deviation, comparing the specification limit spread to the spread of the variation of the data stream. Cpk is equal to the smaller of Cpu or Cpl. Formula

        • Ppk. Capability ratio that is adjusted for non-centred processes, using long-term standard deviation, comparing the specification limit spread to the spread of the variation of the data stream. Ppk is equal to the smaller of Ppu or Ppl. Formula

        • Robustness. Ratio of short term to long term standard deviation, expressed as a percent. The closer this percent is to 100, the more stable the process is over time. Formula

        • Cp. Capability ratio using short-term standard deviation, comparing the specification limit spread to the spread of the variation of the data stream. Formula

        • Pp. Ratio of the process variability (six sigma) with the width of the specification limits (total tolerance). The standard deviation (sigma) is calculated using the root mean square method (RMS). Formula

        • Yield (Expected). Percentage of expected good pieces from total pieces measured.
        • Yield (Potential). Percentage of potential good pieces from total pieces measured.

        • Give Away %. Percentage of weight, volume or count that was overfilled to ensure compliance. Formula

        • Mean. Arithmetic average of a given data set, where N represents the number of values in the data set. Formula

        • SD (ST). Short-term process variation estimated from either the within-subgroup standard deviation (for n > 1) or moving standard deviation (for n = 1) of the subgroups. Formula

        • SD (LT). Variation representing the average deviation of values from their mean, often called the RMS (root mean square) method of calculating sigma. Formula

        • Overfill LSC. Difference between Mean and Label Stated Content. Formula

        • Specification Events. Number of specification limit violation events.
     3. To display the lot in the 2D sub tile, select Display Lot.
     4. Select OK.
   • Removing Tiles

     Using this procedure, you will remove the 2D Chart.

     1. In the unlocked dashboard, locate the 2D Chart.

        For more information, please see Locking/Unlocking Dashboards.

     2. In the 2D Chart, select More and then select Remove Tile .
     3. Select Save.