Managing 2D Charts
The 2D Chart tile displays the graphical views for a selected statistic of process performance based on historical data from processfeature combinations, including Cpk, Ppk, yield (expected and potential), and mean, among others.
When you select the parameter set on the dashboard, it will affect the contents of this tile.

In the aggregated dashboard toolbar, select Add Tile and then select the 2D Chart tile.

In the 2D Chart tile, you can do the following:
 Selecting Parameter Sets

Displaying Statistic
Using this procedure, you will select the statistic displayed in the 2D Chart tile.

In the Select Statistic dropdown list, select the desired statistic.
Available Statistics
Cpk. Capability ratio that is adjusted for noncentered processes, using shortterm standard deviation, comparing the specification limit spread to the spread of the variation of the data stream. Cpk is equal to the smaller of Cpu or Cpl. Formula

Ppk. Capability ratio that is adjusted for noncentered processes, using longterm standard deviation, comparing the specification limit spread to the spread of the variation of the data stream. Ppk is equal to the smaller of Ppu or Ppl. Formula

Robustness. Ratio of short term to long term standard deviation, expressed as a percent. The closer this percent is to 100, the more stable the process is over time. Formula

Cp. Capability ratio using shortterm standard deviation, comparing the specification limit spread to the spread of the variation of the data stream. Formula

Pp. Ratio of the process variability (six sigma) with the width of the specification limits (total tolerance). The standard deviation (sigma) is calculated using the root mean square method (RMS). Formula
 Yield (Expected). Percentage of expected good pieces from total pieces measured.
 Yield (Potential). Percentage of potential good pieces from total pieces measured.

Give Away %. Percentage of weight, volume, or count that was overfilled to ensure compliance. Formula

Mean. Arithmetic average of a given data set, where N represents the number of values in the data set. Formula

SD (ST). Shortterm process variation estimated from either the withinsubgroup standard deviation (for n > 1) or moving standard deviation (for n = 1) of the subgroups. Formula

SD (LT). Variation representing the average deviation of values from their mean, often called the RMS (root mean square) method of calculating sigma. Formula

Overfill LSC. Difference between Mean and Label Stated Content. Formula
 Specification Events. Number of specification limit violation events.

 To display the lot in the 2D sub tile, select Display Lot.
 Select OK.

Removing Tiles
Using this procedure, you will remove the 2D Chart.

In the unlocked dashboard, locate the 2D Chart.
For more information, please see Locking/Unlocking Dashboards.
 In the 2D Chart, select More and then select Remove Tile.
 Select Save.
